Particle Trajectory Applications
Low Energy Beam Transport (LEBT)
system - courtesy of Dr. Sami Hahto
Many devices are affected by the motion of charged particles in electric and/or magnetic fields. Applications
utilizing electron or ion beams or traps deliberately make use of this motion. The device performance may
ultimately be limited by the ability to obtain the desired field strengths or spatial distributions.
It may also be affected by practical problems with producing the desired beam intensity or maintaining the
beam intensity along the path without excessive divergence due to its own space charge. Other applications
may be adversely affected by unwanted charged particle motion effects – for example, multipaction in high
power HF applications – where the desired electrical power of a device leads to problems like sparking.
In either case, simulation can greatly diminish the scientific and engineering challenges posed in designing
for optimal performance. It is especially useful in reducing the need for physical prototyping and testing,
replacing it with much faster and less expensive virtual prototyping.
INTEGRATED’s charged particle trajectory simulation module, LORENTZ, provides scientists and engineers with a
powerful tool to address these issues. Features include: many standard emission regimes, beam space charge
effects, full secondary emission statistics, beam emittance, beam spot size and radius, ion mobility, and surface
charging dynamics.
LORENTZ is able to use fields imported from measurement, theory, or other simulations. However, the most common
source of electric and magnetic fields is INTEGRATED’s own 2D and 3D CAE field solvers. These have been on the
market since the 1980’s and are well respected for their speed, accuracy, and ease of use.
Boundary Element Method (BEM), Finite Element Method (FEM) and HYBRID field solvers are all available in the
same package to give you the best method for any given model. You can also independently verify the solution
within one program. These field solvers are integrated seamlessly into your LORENTZ program according to
the needs of your simulation.
All INTEGRATED software includes a parametric solver which automatically produces analysis for variations in
geometry, materials and sources, reducing the tedious, repetitive task of fine-tuning your designs.
Download LORENTZ brochures:
- Deflector plates
- Electron microscopes
- Focusing electrodes
- Ion mobility spectroscopy
- Ion traps
- Ion mass spectrometers
- Ion implanters
- Ion propulsion
- Microchannel plates
- Multipole beamline magnets
- Nanotube field emitters
- Photomultiplier tubes
- Sputtering sources
- Steering magnets
- Time of flight
- X-ray